In this paper, we propose an improved theoretical model of a chip-scale electro-optic (EO) microring modulator (EO-MRM) based on X-cut lithium–niobate-on-insulator (LNOI) with a hybrid architecture consisting of a 180-degree Euler bend in the coupling region, double-layer. In this paper, we propose an improved theoretical model of a chip-scale electro-optic (EO) microring modulator (EO-MRM) based on X-cut lithium–niobate-on-insulator (LNOI) with a hybrid architecture consisting of a 180-degree Euler bend in the coupling region, double-layer. Heterogeneously-integrated electro-optic modulators (EOM) are demonstrated using the hybrid-mode concept, incorporating thin-film lithium niobate (LN) by bonding with silicon nitride (SiN) passive photonics. At wavelengths near 1550 nm, these EOMs demonstrated greater than 30 dB extinction ratio. Abstract: Since the emergence of optical fiber communications, lithium niobate (LN) has been the material of choice for electro-optic modulators, featuring high data bandwidth and excellent signal fidelity. Conventional LN modulators however are bulky, expensive and power hungry, and cannot meet. These modulators, based on lithium niobate, offer a unique combination of performance, robustness, and reliability, even under extreme conditions, making them prime candidates to meet rigorous requirements of laser, sensing, communications, quantum or space applications.
